Experimental and theoretical study of the cracking behavior of sol-gel-derived SiO2 film on InP substrate

J. Liu*, Y. L. Lam, Y. C. Chan, Y. Zhou, Boon Ooi, Z. S. Yun

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

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Engineering & Materials Science

Chemistry