Estimation of capacitive crosstalk-induced short-circuit energy

Mosin Mondal, Sami Kirolos, Yehia Massoud

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


In the nanometer regime, crosstalk significantly impacts the dynamic power consumption of a chip. In this paper, we present a methodology for analyzing crosstalk-induced short-circuit power dissipation in cell-based digital designs. We introduce a new cell pre-characterization technique for facilitating the estimation of crosstalk-induced short-circuit power. Examples demonstrate that the presented methodology is three orders of magnitude faster than circuit simulators while the average error is as low as 3.5%. © 2007 IEEE.
Original languageEnglish (US)
Title of host publicationProceedings - IEEE International Symposium on Circuits and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages4
StatePublished - Jan 1 2007
Externally publishedYes

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2022-09-13


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