Abstract
Deep learning models are prone to being fooled by imperceptible perturbations known as adversarial attacks. In this work, we study how equipping models with Test-time Transformation Ensembling (TTE) can work as a reliable defense against such attacks. While transforming the input data, both at train and test times, is known to enhance model performance, its effects on adversarial robustness have not been studied. Here, we present a comprehensive empirical study of the impact of TTE, in the form of widely-used image transforms, on adversarial robustness. We show that TTE consistently improves model robustness against a variety of powerful attacks without any need for re-training, and that this improvement comes at virtually no trade-off with accuracy on clean samples. Finally, we show that the benefits of TTE transfer even to the certified robustness domain, in which TTE provides sizable and consistent improvements.
Original language | English (US) |
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Title of host publication | Proceedings - 2021 IEEE/CVF International Conference on Computer Vision Workshops, ICCVW 2021 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 81-91 |
Number of pages | 11 |
ISBN (Electronic) | 9781665401913 |
DOIs | |
State | Published - 2021 |
Event | 18th IEEE/CVF International Conference on Computer Vision Workshops, ICCVW 2021 - Virtual, Online, Canada Duration: Oct 11 2021 → Oct 17 2021 |
Publication series
Name | Proceedings of the IEEE International Conference on Computer Vision |
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Volume | 2021-October |
ISSN (Print) | 1550-5499 |
Conference
Conference | 18th IEEE/CVF International Conference on Computer Vision Workshops, ICCVW 2021 |
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Country/Territory | Canada |
City | Virtual, Online |
Period | 10/11/21 → 10/17/21 |
Bibliographical note
Funding Information:Acknowledgments. This work was partially supported by the King Abdullah University of Science and Technology (KAUST) Office of Sponsored Research.
Publisher Copyright:
© 2021 IEEE.
ASJC Scopus subject areas
- Software
- Computer Vision and Pattern Recognition