Abstract
We report here, for the first time, on enhanced nonresonant detection of terahertz radiation using multiple InGaAs/GaAs high-electron-mobility transistors (HEMTs) connected in series and biased by a direct drain current. A 1.63 THz (184 mum) response is proportional to the number of detecting transistors operating in saturation region at the same gate-source bias voltage. The experimental data are in agreement with the detection mechanism based on the rectification of overdamped plasma waves excited by radiation in channels of devices.
Original language | English (US) |
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Title of host publication | 2009 IEEE MTT-S International Microwave Symposium Digest |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 937-940 |
Number of pages | 4 |
ISBN (Print) | 9781424428038 |
DOIs | |
State | Published - Jul 22 2009 |