Elucidating the origin of resistive switching in ultrathin hafnium oxides through high spatial resolution tools

Y. Shi, Y. Ji, F. Hui, V. Iglesias, M. Porti, M. Nafria, E. Miranda, G. Bersuker, M. Lanza

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations

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