Electromagnetic Imaging of Rough Dielectric Surface Profiles using a Single-Frequency Reverse Time Migration Method

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

An electromagnetic imaging scheme, which makes use of a single-frequency reverse time migration (RTM) technique to reconstruct two-dimensional (2D) rough surface profiles from the scattered field data, is formulated and implemented. The unknown surface profile, which is expressed as a one-dimensional height function, is the interface between two dielectric media. It is assumed that the profile is illuminated from one side and the scattered fields are “measured” along a line on this same side. RTM is used to construct a cross-correlation imaging functional that is numerically evaluated to yield an image of the investigation domain. The maxima of this functional yields an accurate reconstruction of the rough dielectric surface profile.
Original languageEnglish (US)
Title of host publication2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (USNC-URSI)
PublisherIEEE
DOIs
StatePublished - Jul 23 2023

Bibliographical note

KAUST Repository Item: Exported on 2023-09-11

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