In this work, an efficient algorithm for the reconstruction of a one dimensional dielectric random rough surface profile is presented. First the synthetic scattering field data is obtained by the solution of the direct problem through the conventional surface integral equations. Then the same surface integral equations together with the data equation are solved in an iterative fashion to reconstruct the surface variation. In the numerical implementation, the so called ill-posed inverse problem is regularized in the sense of Tikhonov. Preliminary numerical results show that the method is effective and promising.
|Title of host publication
|2019 5th International Electromagnetic Compatibility Conference, EMC Turkiye 2019
|Institute of Electrical and Electronics Engineers Inc.
|Published - Sep 1 2019