Electromagnetic imaging of random rough surface profiles

Ahmet Sefer; Ali Yapar

doi:10.1109/EMCTurkiye45372.2019.8976026

Electromagnetic imaging of random rough surface profiles

Ahmet Sefer, Ali Yapar

Computer, Electrical and Mathematical Sciences and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

In this work, an efficient algorithm for the reconstruction of a one dimensional dielectric random rough surface profile is presented. First the synthetic scattering field data is obtained by the solution of the direct problem through the conventional surface integral equations. Then the same surface integral equations together with the data equation are solved in an iterative fashion to reconstruct the surface variation. In the numerical implementation, the so called ill-posed inverse problem is regularized in the sense of Tikhonov. Preliminary numerical results show that the method is effective and promising.

Original language	English (US)
Title of host publication	2019 5th International Electromagnetic Compatibility Conference, EMC Turkiye 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781728118352
DOIs	https://doi.org/10.1109/EMCTurkiye45372.2019.8976026
State	Published - Sep 1 2019

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2023-10-23

Access to Document

10.1109/EMCTurkiye45372.2019.8976026

Cite this

@inproceedings{3b91aea3e5554d0cb5dc4447bf90012e,

title = "Electromagnetic imaging of random rough surface profiles",

abstract = "In this work, an efficient algorithm for the reconstruction of a one dimensional dielectric random rough surface profile is presented. First the synthetic scattering field data is obtained by the solution of the direct problem through the conventional surface integral equations. Then the same surface integral equations together with the data equation are solved in an iterative fashion to reconstruct the surface variation. In the numerical implementation, the so called ill-posed inverse problem is regularized in the sense of Tikhonov. Preliminary numerical results show that the method is effective and promising.",

author = "Ahmet Sefer and Ali Yapar",

note = "Generated from Scopus record by KAUST IRTS on 2023-10-23",

year = "2019",

month = sep,

day = "1",

doi = "10.1109/EMCTurkiye45372.2019.8976026",

language = "English (US)",

isbn = "9781728118352",

booktitle = "2019 5th International Electromagnetic Compatibility Conference, EMC Turkiye 2019",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

}

TY - GEN

T1 - Electromagnetic imaging of random rough surface profiles

AU - Sefer, Ahmet

AU - Yapar, Ali

N1 - Generated from Scopus record by KAUST IRTS on 2023-10-23

PY - 2019/9/1

Y1 - 2019/9/1

N2 - In this work, an efficient algorithm for the reconstruction of a one dimensional dielectric random rough surface profile is presented. First the synthetic scattering field data is obtained by the solution of the direct problem through the conventional surface integral equations. Then the same surface integral equations together with the data equation are solved in an iterative fashion to reconstruct the surface variation. In the numerical implementation, the so called ill-posed inverse problem is regularized in the sense of Tikhonov. Preliminary numerical results show that the method is effective and promising.

AB - In this work, an efficient algorithm for the reconstruction of a one dimensional dielectric random rough surface profile is presented. First the synthetic scattering field data is obtained by the solution of the direct problem through the conventional surface integral equations. Then the same surface integral equations together with the data equation are solved in an iterative fashion to reconstruct the surface variation. In the numerical implementation, the so called ill-posed inverse problem is regularized in the sense of Tikhonov. Preliminary numerical results show that the method is effective and promising.

UR - https://ieeexplore.ieee.org/document/8976026/

UR - http://www.scopus.com/inward/record.url?scp=85079348741&partnerID=8YFLogxK

U2 - 10.1109/EMCTurkiye45372.2019.8976026

DO - 10.1109/EMCTurkiye45372.2019.8976026

M3 - Conference contribution

SN - 9781728118352

BT - 2019 5th International Electromagnetic Compatibility Conference, EMC Turkiye 2019

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Electromagnetic imaging of random rough surface profiles

Abstract

Bibliographical note

Access to Document

Other files and links

Fingerprint

Cite this