Electrically Enhanced Exchange Bias via Solid-State Magneto-ionics

Peyton D. Murray, Christopher J. Jensen, Alberto Quintana, Junwei Zhang, Xixiang Zhang, Alexander J. Grutter, Brian J. Kirby, Kai Liu

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

Electrically induced ionic motion offers a new way to realize voltage-controlled magnetism, opening the door to a new generation of logic, sensor, and data storage technologies. Here, we demonstrate an effective approach to magneto-ionically and electrically tune the exchange bias in Gd/Ni1–xCoxO thin films (x = 0.50 and 0.67), where neither of the layers alone is ferromagnetic at room temperature. The Gd capping layer deposited onto antiferromagnetic Ni1–xCoxO initiates a solid-state redox reaction that reduces an interfacial region of the oxide to ferromagnetic NiCo. An exchange bias is established after field cooling (FC), which can be enhanced by up to 35% after a voltage conditioning and subsequently reset with a second FC. These effects are caused by the presence of an interfacial ferromagnetic NiCo layer, which further alloys with the Gd layer upon FC and voltage application, as confirmed by electron microscopy and polarized neutron reflectometry studies. These results highlight the viability of the solid-state magneto-ionic approach to achieve electric control of exchange bias, with potential for energy-efficient magneto-ionic devices.
Original languageEnglish (US)
JournalACS Applied Materials & Interfaces
DOIs
StatePublished - Aug 4 2021

Bibliographical note

KAUST Repository Item: Exported on 2021-08-06
Acknowledged KAUST grant number(s): OSR-2019-CRG8-4081
Acknowledgements: This work was supported in part by the NSF (ECCS-1611424 and ECCS-1933527), by SMART, one of the seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by the National Institute of Standards and Technology (NIST), and by KAUST (OSR-2019-CRG8-4081). The acquisition of a Magnetic Property Measurements System (MPMS3) at GU which was used in this investigation was supported by the NSF (DMR-1828420). We thank Professor Yayoi Takamura for helpful discussions

ASJC Scopus subject areas

  • General Materials Science

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