Electrically active dislocations at the Si/GaAs interface

Sergei Lopatin*, G. Duscher

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish (US)
    Pages (from-to)336-337
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume10
    Issue numberSUPPL. 2
    DOIs
    StatePublished - Sep 24 2004

    ASJC Scopus subject areas

    • Instrumentation

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