TY - GEN
T1 - Electrical stability of PLEDs
AU - Kar, Yap Boon
AU - Bradley, Donal
N1 - Generated from Scopus record by KAUST IRTS on 2019-11-27
PY - 2010/12/1
Y1 - 2010/12/1
N2 - We report the impact of inserting a 10 nm thickness interlayer between the poly(3,4-ethylenedioxythiophene):poly(styrenesulphonate) (PEDOT:PSS) and light-emitting layers on degradation, in particular the electrical stability of the injecting electrodes, in encapsulated polymer light emitting diodes (PLEDs). Continuous electrical stress testing is carried out to study the time evolution of dark injection hole transients for devices with and without a poly [2,7-(9,9-di-n-octylfluorene)-alt-(1,4-phenylene-((4-secbutylphenyl)imino)-1, 4-phenylene)] (TFB) interlayer. A Sumitomo Chemical Company dibenzothiophene phenylenediamine copolymer (SC002) was used as light emitting layer and PLED characteristics with and without the interlayer are discussed together with lifetime data. ©2010 IEEE.
AB - We report the impact of inserting a 10 nm thickness interlayer between the poly(3,4-ethylenedioxythiophene):poly(styrenesulphonate) (PEDOT:PSS) and light-emitting layers on degradation, in particular the electrical stability of the injecting electrodes, in encapsulated polymer light emitting diodes (PLEDs). Continuous electrical stress testing is carried out to study the time evolution of dark injection hole transients for devices with and without a poly [2,7-(9,9-di-n-octylfluorene)-alt-(1,4-phenylene-((4-secbutylphenyl)imino)-1, 4-phenylene)] (TFB) interlayer. A Sumitomo Chemical Company dibenzothiophene phenylenediamine copolymer (SC002) was used as light emitting layer and PLED characteristics with and without the interlayer are discussed together with lifetime data. ©2010 IEEE.
UR - http://ieeexplore.ieee.org/document/5700945/
UR - http://www.scopus.com/inward/record.url?scp=79951780891&partnerID=8YFLogxK
U2 - 10.1109/ESCINANO.2010.5700945
DO - 10.1109/ESCINANO.2010.5700945
M3 - Conference contribution
SN - 9781424488544
BT - 2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Proceedings
ER -