Electrical properties of CN_x nanotubes probed in a transmission electron microscope

Knowledge of the mechanical and electrical characteristics of one-dimensional nanostructures is critical for their future integration in nanoelectronic circuits. The present study analyses the behaviour of N-doped carbon nanotubes (CN_x,x<0.1) under applied stresses inside a transmission electron microscope. The electrical resistance changes observed were substantial, with figures ranging from 42 to 182 k∈Ω, and are largely correlated with the extension of the contact area (electrode-nanotube or nanotube-nanotube). Despite the repeated deformation cycles and high bending angles achieved, the nanotubes kept their metallic nature throughout. In addition to this, it was noticed that the CN_x nanotubes presented sections with several structural defects which acted as joints during their controlled bending. These areas represent high-resistive points which may lead to fatal structural failure, as demonstrated in the current induced failure experiments here reported.