Electrical limit of silver nanowire electrodes: Direct measurement of the nanowire junction resistance

Franz Selzer, Carlo Floresca, David Kneppe, Ludwig Bormann, Christoph Sachse, Nelli Weiß, Alexander Eychmüller, Aram Amassian, Lars Müller-Meskamp, Karl Leo

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43 Scopus citations


We measure basic network parameters of silvernanowire (AgNW) networks commonly used as transparent conductingelectrodes in organic optoelectronic devices. By means of four point probing with nanoprobes, the wire-to-wire junction resistance and the resistance of single nanowires are measured. The resistanceRNW of a single nanowire shows a value of RNW=(4.96±0.18) Ω/μm. The junction resistanceRJ differs for annealed and non-annealed NW networks, exhibiting values of RJ=(25.2±1.9) Ω (annealed) and RJ=(529±239) Ω (non-annealed), respectively. Our simulation achieves a good agreement between the measured network parameters and the sheet resistanceRS of the entire network. Extrapolating RJ to zero, our study show that we are close to the electrical limit of the conductivity of our AgNW system: We obtain a possible RS reduction by only ≈20% (common RS≈10 Ω/sq). Therefore, we expect further performance improvements in AgNW systems mainly by increasing NW length or by utilizing novel network geometries.
Original languageEnglish (US)
Pages (from-to)163302
JournalApplied Physics Letters
Issue number16
StatePublished - Apr 19 2016

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01
Acknowledgements: This work was funded by the European Community’s
Seventh Framework Program (FP7/2007-2013) under Grant
Agreement No. 314068 and within the DFG Cluster of
Excellence “Center for Advancing Electronics Dresden.”


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