Electrical Characterization of Solar-Blind Deep-Ultraviolet (Al0.28Ga0.72)2O3Schottky Photodetectors Grown on Silicon by Pulsed Laser Deposition

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Abstract

This study reports on (Al0.28Ga0.72)2O3-based ultraviolet-C Schottky metal-semiconductor-metal and metal-insulator-metal photodetectors with peak responsivities of 1.17 and 0.40 A/W, respectively, for an incident-light wavelength of 230 nm at 2.50 V reverse-bias. © 2019 The Author (s)
Original languageEnglish (US)
Title of host publicationConference on Lasers and Electro-Optics
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
ISBN (Print)9781943580576
DOIs
StatePublished - Jul 1 2019

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01
Acknowledged KAUST grant number(s): BAS/1/1614-01-01
Acknowledgements: The authors acknowledge receipt of the King Abdulaziz City for Science and Technology (KACST) grant no. KACST TIC R2-FP-000, KAUST baseline funding, BAS/1/1614-01-01, and MBE equipment funding C/M-20000-12-001-77

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