Electrical and piezoelectric properties of BiFeO3 thin films grown on SrxCa1−xRuO3-buffered SrTiO3 substrates

Yingbang Yao, Long Chen, Zhihong Wang, Husam N. Alshareef, Xixiang Zhang

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


(001)-oriented BiFeO 3 (BFO) thin films were grown on Sr xCa 1-xRuO 3- (SCRO; x = 1, 0.67, 0.33, 0) buffered SrTiO 3 (001) substrates using pulsed laser deposition. The microstructural, electrical, ferroelectric, and piezoelectric properties of the thin films were considerably affected by the buffer layers. The interface between the BFO films and the SCRO-buffer layer was found to play a dominant role in determining the electrical and piezoelectric behaviors of the films. We found that films grown on SrRuO 3-buffer layers exhibited minimal electrical leakage while films grown on Sr 0.33Ca 0.67RuO 3-buffer layers had the largest piezoelectric response. The origin of this difference is discussed. © 2012 American Institute of Physics.
Original languageEnglish (US)
Pages (from-to)114102
JournalJournal of Applied Physics
Issue number11
StatePublished - Jun 4 2012

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this