@inproceedings{9f59b2b90b814874b0656d040249ec58,
title = "Electrical and optoelectronic characterization of a ZnO nanowire contacted by focused-ion-beam-deposited Pt",
abstract = "We report on the transport properties of single ZnO nanowires measured as a function of the length/square of radius ratio via transmission line method. The specific contact resistance of the FIB Pt contacts to the ZnO nanowires is determined as low as 1.1x10-5 Ωcm2. The resistivity of the ZnO nanowires is measured to be 2.2x10-2 Ωcm. ZnO nanowire-based UV photodetectors contacted by the FIB-Pt with the photoconductive gain as high as ∼108 have been fabricated and characterized.",
author = "Chen, {C. Y.} and Chang, {P. H.} and Tsai, {K. T.} and He, {J. H.}",
year = "2010",
doi = "10.1109/INEC.2010.5424962",
language = "English (US)",
isbn = "9781424435449",
series = "INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings",
pages = "1177--1178",
booktitle = "INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings",
note = "2010 3rd International Nanoelectronics Conference, INEC 2010 ; Conference date: 03-01-2010 Through 08-01-2010",
}