Abstract
This paper presents a comparative study of the magnitude of the electric fields in AlGaN/GaN quantum well structures, measured using electron holography in a transmission electron microscope and estimated from a comparison of low temperature photoluminescence peak energies with calculated values. The values derived from the two techniques were found to be in reasonable agreement for the structures examined here. A larger field across the GaN well was observed from a single quantum well compared to a 10 period structure with equivalent well thickness, while the presence of an electric field across the barrier of the single quantum well was also detected by electron holography.
Original language | English (US) |
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Pages (from-to) | 1551-1559 |
Number of pages | 9 |
Journal | Physica Status Solidi (B) Basic Research |
Volume | 243 |
Issue number | 7 |
DOIs | |
State | Published - Jun 2006 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics