Electric-field-resolved near-infrared microscopy

Mikhail Mamaikin; Yik Long Li; Enrico Ridente; Wei Ting Chen; Joon Suh Park; Alexander Y. Zhu; Federico Capasso; Matthew Weidman; Martin Schultze; Ferenc Krausz; Nicholas Karpowicz

doi:10.1364/OPTICA.454562

Electric-field-resolved near-infrared microscopy

Mikhail Mamaikin, Yik Long Li, Enrico Ridente, Wei Ting Chen, Joon Suh Park, Alexander Y. Zhu, Federico Capasso, Matthew Weidman, Martin Schultze, Ferenc Krausz, Nicholas Karpowicz

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

Access to the complete spatiotemporal response of matter due to structured light requires field sampling techniques with sub-wavelength resolution in time and space. We demonstrate spatially resolved electro-optic sampling of near-infrared waveforms, providing a versatile platform for the direct measurement of electric field dynamics produced by photonic devices and sub-wavelength structures both in the far and near fields. This approach offers high-resolution, time- or frequency-resolved imaging by encoding a broadband signal into a narrowband blueshifted image, lifting the resolution limits imposed by both chromatic aberration and diffraction. Specifically, measuring the field of a near-infrared laser with a broadband sampling laser, we achieve 1.2 µm resolution in space and 2.2 fs resolution in time. This provides an essential diagnostic for complete spatiotemporal control of light with metasurface components, demonstrated via a metalens as well as a meta-axicon that forms broadband, ultrashort, truncated Bessel beams in the near infrared. Finally, we demonstrate the electric field dynamics of locally enhanced hot spots with sub-wavelength dimensions, recording the full temporal evolution of the electric field at each point in the image simultaneously. The imaging modality opens a path toward hyperspectral microscopy with simultaneous sub-wavelength resolution and wide-field imaging capability.

Original language	English (US)
Pages (from-to)	616-622
Number of pages	7
Journal	Optica
Volume	9
Issue number	6
DOIs	https://doi.org/10.1364/OPTICA.454562
State	Published - Jun 9 2022
Externally published	Yes

Bibliographical note

KAUST Repository Item: Exported on 2022-07-01
Acknowledged KAUST grant number(s): OSR-2016-CRG5-2995
Acknowledgements: Air Force Office of Scientific Research (FA9550-14-1-0389, FA9550-16-1-0073, FA9550-16-1-0156); King Abdullah University of Science and Technology (OSR-2016-CRG5-2995). This work was partially supported by the Air Force Office of Scientific Research, by King Abdullah University of Science and Technology (KAUST), by the Munich Centre for Advanced Photonics, and by the IMPRS-APS. F. C. acknowledges support from the Humboldt Research Award of the Alexander von Humboldt Foundation. N. K. was partially supported by the FISR-CNR project “TECNOMED—Tecnopolo di nanotecnologia e fotonica per la medicina di precision.”
This publication acknowledges KAUST support, but has no KAUST affiliated authors.

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics

Access to Document

10.1364/OPTICA.454562

Cite this

@article{90634c1ca2634bf0b920737b9c9bd6ab,

title = "Electric-field-resolved near-infrared microscopy",

abstract = "Access to the complete spatiotemporal response of matter due to structured light requires field sampling techniques with sub-wavelength resolution in time and space. We demonstrate spatially resolved electro-optic sampling of near-infrared waveforms, providing a versatile platform for the direct measurement of electric field dynamics produced by photonic devices and sub-wavelength structures both in the far and near fields. This approach offers high-resolution, time- or frequency-resolved imaging by encoding a broadband signal into a narrowband blueshifted image, lifting the resolution limits imposed by both chromatic aberration and diffraction. Specifically, measuring the field of a near-infrared laser with a broadband sampling laser, we achieve 1.2 µm resolution in space and 2.2 fs resolution in time. This provides an essential diagnostic for complete spatiotemporal control of light with metasurface components, demonstrated via a metalens as well as a meta-axicon that forms broadband, ultrashort, truncated Bessel beams in the near infrared. Finally, we demonstrate the electric field dynamics of locally enhanced hot spots with sub-wavelength dimensions, recording the full temporal evolution of the electric field at each point in the image simultaneously. The imaging modality opens a path toward hyperspectral microscopy with simultaneous sub-wavelength resolution and wide-field imaging capability.",

author = "Mikhail Mamaikin and Li, {Yik Long} and Enrico Ridente and Chen, {Wei Ting} and Park, {Joon Suh} and Zhu, {Alexander Y.} and Federico Capasso and Matthew Weidman and Martin Schultze and Ferenc Krausz and Nicholas Karpowicz",

note = "KAUST Repository Item: Exported on 2022-07-01 Acknowledged KAUST grant number(s): OSR-2016-CRG5-2995 Acknowledgements: Air Force Office of Scientific Research (FA9550-14-1-0389, FA9550-16-1-0073, FA9550-16-1-0156); King Abdullah University of Science and Technology (OSR-2016-CRG5-2995). This work was partially supported by the Air Force Office of Scientific Research, by King Abdullah University of Science and Technology (KAUST), by the Munich Centre for Advanced Photonics, and by the IMPRS-APS. F. C. acknowledges support from the Humboldt Research Award of the Alexander von Humboldt Foundation. N. K. was partially supported by the FISR-CNR project “TECNOMED—Tecnopolo di nanotecnologia e fotonica per la medicina di precision.” This publication acknowledges KAUST support, but has no KAUST affiliated authors.",

year = "2022",

month = jun,

day = "9",

doi = "10.1364/OPTICA.454562",

language = "English (US)",

volume = "9",

pages = "616--622",

journal = "Optica",

issn = "2334-2536",

publisher = "Optical Society of America",

number = "6",

}

TY - JOUR

T1 - Electric-field-resolved near-infrared microscopy

AU - Mamaikin, Mikhail

AU - Li, Yik Long

AU - Ridente, Enrico

AU - Chen, Wei Ting

AU - Park, Joon Suh

AU - Zhu, Alexander Y.

AU - Capasso, Federico

AU - Weidman, Matthew

AU - Schultze, Martin

AU - Krausz, Ferenc

AU - Karpowicz, Nicholas

N1 - KAUST Repository Item: Exported on 2022-07-01 Acknowledged KAUST grant number(s): OSR-2016-CRG5-2995 Acknowledgements: Air Force Office of Scientific Research (FA9550-14-1-0389, FA9550-16-1-0073, FA9550-16-1-0156); King Abdullah University of Science and Technology (OSR-2016-CRG5-2995). This work was partially supported by the Air Force Office of Scientific Research, by King Abdullah University of Science and Technology (KAUST), by the Munich Centre for Advanced Photonics, and by the IMPRS-APS. F. C. acknowledges support from the Humboldt Research Award of the Alexander von Humboldt Foundation. N. K. was partially supported by the FISR-CNR project “TECNOMED—Tecnopolo di nanotecnologia e fotonica per la medicina di precision.” This publication acknowledges KAUST support, but has no KAUST affiliated authors.

PY - 2022/6/9

Y1 - 2022/6/9

N2 - Access to the complete spatiotemporal response of matter due to structured light requires field sampling techniques with sub-wavelength resolution in time and space. We demonstrate spatially resolved electro-optic sampling of near-infrared waveforms, providing a versatile platform for the direct measurement of electric field dynamics produced by photonic devices and sub-wavelength structures both in the far and near fields. This approach offers high-resolution, time- or frequency-resolved imaging by encoding a broadband signal into a narrowband blueshifted image, lifting the resolution limits imposed by both chromatic aberration and diffraction. Specifically, measuring the field of a near-infrared laser with a broadband sampling laser, we achieve 1.2 µm resolution in space and 2.2 fs resolution in time. This provides an essential diagnostic for complete spatiotemporal control of light with metasurface components, demonstrated via a metalens as well as a meta-axicon that forms broadband, ultrashort, truncated Bessel beams in the near infrared. Finally, we demonstrate the electric field dynamics of locally enhanced hot spots with sub-wavelength dimensions, recording the full temporal evolution of the electric field at each point in the image simultaneously. The imaging modality opens a path toward hyperspectral microscopy with simultaneous sub-wavelength resolution and wide-field imaging capability.

AB - Access to the complete spatiotemporal response of matter due to structured light requires field sampling techniques with sub-wavelength resolution in time and space. We demonstrate spatially resolved electro-optic sampling of near-infrared waveforms, providing a versatile platform for the direct measurement of electric field dynamics produced by photonic devices and sub-wavelength structures both in the far and near fields. This approach offers high-resolution, time- or frequency-resolved imaging by encoding a broadband signal into a narrowband blueshifted image, lifting the resolution limits imposed by both chromatic aberration and diffraction. Specifically, measuring the field of a near-infrared laser with a broadband sampling laser, we achieve 1.2 µm resolution in space and 2.2 fs resolution in time. This provides an essential diagnostic for complete spatiotemporal control of light with metasurface components, demonstrated via a metalens as well as a meta-axicon that forms broadband, ultrashort, truncated Bessel beams in the near infrared. Finally, we demonstrate the electric field dynamics of locally enhanced hot spots with sub-wavelength dimensions, recording the full temporal evolution of the electric field at each point in the image simultaneously. The imaging modality opens a path toward hyperspectral microscopy with simultaneous sub-wavelength resolution and wide-field imaging capability.

UR - http://hdl.handle.net/10754/679536

UR - https://opg.optica.org/abstract.cfm?URI=optica-9-6-616

UR - http://www.scopus.com/inward/record.url?scp=85132536552&partnerID=8YFLogxK

U2 - 10.1364/OPTICA.454562

DO - 10.1364/OPTICA.454562

M3 - Article

SN - 2334-2536

VL - 9

SP - 616

EP - 622

JO - Optica

JF - Optica

IS - 6

ER -

Electric-field-resolved near-infrared microscopy

Abstract

Bibliographical note

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this