Effect of body biasing on embedded SRAM failure

Amin Khajeh, Ahmed M. Eltawil, Fadi J. Kurdahi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


This paper studies the tradeoffs when using body biasing as a power consumption modulator for Static Random Access Memories (SRAM) in term of reliability versus power consumption. We show that for fault tolerant applications such as wireless applications and multimedia, utilizing body biasing combined with voltage scaling can result in up to 47% power saving compared to the nominal case, while, for the same scenario, utilizing only voltage scaling will result in 20% power saving in the memory compared to nominal case. ©2010 IEEE.
Original languageEnglish (US)
Title of host publicationISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems
StatePublished - Aug 31 2010
Externally publishedYes

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2019-11-20


Dive into the research topics of 'Effect of body biasing on embedded SRAM failure'. Together they form a unique fingerprint.

Cite this