TY - GEN
T1 - Effect of body biasing on embedded SRAM failure
AU - Khajeh, Amin
AU - Eltawil, Ahmed M.
AU - Kurdahi, Fadi J.
N1 - Generated from Scopus record by KAUST IRTS on 2019-11-20
PY - 2010/8/31
Y1 - 2010/8/31
N2 - This paper studies the tradeoffs when using body biasing as a power consumption modulator for Static Random Access Memories (SRAM) in term of reliability versus power consumption. We show that for fault tolerant applications such as wireless applications and multimedia, utilizing body biasing combined with voltage scaling can result in up to 47% power saving compared to the nominal case, while, for the same scenario, utilizing only voltage scaling will result in 20% power saving in the memory compared to nominal case. ©2010 IEEE.
AB - This paper studies the tradeoffs when using body biasing as a power consumption modulator for Static Random Access Memories (SRAM) in term of reliability versus power consumption. We show that for fault tolerant applications such as wireless applications and multimedia, utilizing body biasing combined with voltage scaling can result in up to 47% power saving compared to the nominal case, while, for the same scenario, utilizing only voltage scaling will result in 20% power saving in the memory compared to nominal case. ©2010 IEEE.
UR - http://ieeexplore.ieee.org/document/5537193/
UR - http://www.scopus.com/inward/record.url?scp=77955995603&partnerID=8YFLogxK
U2 - 10.1109/ISCAS.2010.5537193
DO - 10.1109/ISCAS.2010.5537193
M3 - Conference contribution
SN - 9781424453085
BT - ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems
ER -