We present a complete description of "topological darkness" in a threedimensional space regarding optical constants (i.e., n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.
|Original language||English (US)|
|Title of host publication||2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||2|
|State||Published - Oct 25 2017|