Dispersion and cutoff frequency are essential parameters for microwave waveguides and their versatile applications in communication and sensing. In this work, we propose the concept of substrate-integrated impedance surface (SIIS) that enables arbitrary control of dispersion in closed-shape waveguides and demonstrate that a substrate-integrated waveguide (SIW) loaded with a capacitive SIIS (e.g., an array of blind vias) does not have only a reduced cutoff frequency, but also exhibits effects of slow-wave propagation and field localization. The proposed SIIS technique may have broad relevance beyond miniaturization of waveguide components, as it may also open exciting prospects for ultrasensitive microwave sensing and enhancement of nonlinear properties in active waveguides.
|Original language||English (US)|
|Title of host publication||2019 United States National Committee of URSI National Radio Science Meeting (USNC-URSI NRSM)|
|Publisher||Institute of Electrical and Electronics Engineers (IEEE)|
|State||Published - Jan 2019|