Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport

Ruipeng Li; Jeremy W. Ward; Detlef Matthias Smilgies; Marcia M. Payne; John Edward Anthony; Oana D. Jurchescu; Aram Amassian

doi:10.1002/adma.201201856

Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport

Ruipeng Li, Jeremy W. Ward, Detlef Matthias Smilgies, Marcia M. Payne, John Edward Anthony, Oana D. Jurchescu, Aram Amassian

Research output: Contribution to journal › Article › peer-review

68 Scopus citations

Abstract

X-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Original language	English (US)
Pages (from-to)	5553-5558
Number of pages	6
Journal	Advanced Materials
Volume	24
Issue number	41
DOIs	https://doi.org/10.1002/adma.201201856
State	Published - Aug 10 2012

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01
Acknowledged KAUST grant number(s): FIC/2010/04
Acknowledgements: We are grateful to Mr. Mohammed Balamesh for his important contributions to the operational readiness of the Organic Electronics and Photovoltaics Laboratory at King Abdullah University of Science and Technology. Part of this work was supported by KAUST's Office of Competitive Research Funds under award number FIC/2010/04. We acknowledge use of the D1 beam line at the Cornell High Energy Synchrotron Source supported by the National Science Foundation (NSF DMR-0225180) and NIH-NIGMS. JWW and ODJ acknowledge financial support from the National Science Foundation (ECCS-1102275). We thank Jake Mohin (Carnegie-Mellon University) and Dave Schuller (MacCHESS) for their help with the micrograph metrology software as well as Sterling Cornaby, Tom Szebenyi, and Don Bilderback (CHESS) for providing the high-quality x-ray focusing capillary.

ASJC Scopus subject areas

Mechanics of Materials
General Materials Science
Mechanical Engineering

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10.1002/adma.201201856

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title = "Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport",

abstract = "X-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel. {\textcopyright} 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.",

author = "Ruipeng Li and Ward, {Jeremy W.} and Smilgies, {Detlef Matthias} and Payne, {Marcia M.} and Anthony, {John Edward} and Jurchescu, {Oana D.} and Aram Amassian",

note = "KAUST Repository Item: Exported on 2020-10-01 Acknowledged KAUST grant number(s): FIC/2010/04 Acknowledgements: We are grateful to Mr. Mohammed Balamesh for his important contributions to the operational readiness of the Organic Electronics and Photovoltaics Laboratory at King Abdullah University of Science and Technology. Part of this work was supported by KAUST's Office of Competitive Research Funds under award number FIC/2010/04. We acknowledge use of the D1 beam line at the Cornell High Energy Synchrotron Source supported by the National Science Foundation (NSF DMR-0225180) and NIH-NIGMS. JWW and ODJ acknowledge financial support from the National Science Foundation (ECCS-1102275). We thank Jake Mohin (Carnegie-Mellon University) and Dave Schuller (MacCHESS) for their help with the micrograph metrology software as well as Sterling Cornaby, Tom Szebenyi, and Don Bilderback (CHESS) for providing the high-quality x-ray focusing capillary.",

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AU - Jurchescu, Oana D.

AU - Amassian, Aram

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Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport

Abstract

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