Direct correlation of organic semiconductor film structure to field-effect mobility

Dean M. DeLongchamp*, Sharadha Sambasivan, Daniel A. Fischer, Eric K. Lin, Paul Chang, Amanda R. Murphy, Jean M.J. Fréchet, Vivek Subramanian

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

74 Scopus citations


The use of near-edge X-ray absorption fine structure (NEXAFS) spectroscopy to track the effects of thermal processing on the chemistry and structure of oligothiophene percursor films is demonstrated. A thermal treatment series was created by heating films to temperatures between 75°C and 300°C for 20 min and then cooling them to room temperature. To quantify chemical conversion, spectra were collected for the entire temperature-treatment sample series. The results show that the highest mobilities are obtained upto 250°C, even though the film is only slightly more than a monolayer thick by quantification of surface coverage.

Original languageEnglish (US)
Pages (from-to)2340-2344
Number of pages5
JournalAdvanced Materials
Issue number19
StatePublished - Oct 4 2005
Externally publishedYes

ASJC Scopus subject areas

  • General Materials Science
  • Mechanics of Materials
  • Mechanical Engineering


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