Digital-logic assessment of junctionless twin gate trench channel (JL-TGTC) MOSFET for memory circuit applications

Ajay Kumar*, Neha Gupta, Aditya Jain, Rajeev Gupta, Bharat Choudhary, Kaushal Kumar, Amit Kumar Goyal, Yehia Massoud

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

In this paper, Junctionless Twin Gate Trench Channel (JL-TGTC) MOSFET with individual gate control is realized. The device gives full functionality of 2-input digital ‘AND’ and ‘NAND’ logics. The simulation depicts the results in the form of various parameters such as cutoff current, transfer characteristics, and potential profiles. All the simulations regarding device structure and functionality are done on TCAD. This new type of MOS device has improved applicability in low-voltage digital electronics such as sequential circuits etc.

Original languageEnglish (US)
Article number100087
JournalMemories - Materials, Devices, Circuits and Systems
Volume6
DOIs
StatePublished - Dec 2023

Bibliographical note

Publisher Copyright:
© 2023 The Authors

Keywords

  • AND gate
  • JL-TGTC
  • MOSFET
  • NAND gate
  • Potential

ASJC Scopus subject areas

  • Engineering (miscellaneous)
  • Computational Mechanics
  • General Materials Science
  • Electrical and Electronic Engineering
  • Computer Science (miscellaneous)

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