Digital Holography Microscopy (DHM): Fast and robust systems for Industrial Inspection with interferometer resolution

Yves Emery*, Etienne Cuche, François Marquet, Nicolas Aspert, Pierre Marquet, Jonas Kühn, Mikhail Botkine, Tristian Colomb, Frederic Montfort, Florian Charrière, Christian Depeursinge

*Corresponding author for this work

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