Abstract
In this work we analyze the effects of electromagnetic-induced interferences conveyed at the input of a transimpedance CMOS operational amplifier. In particular, it will be highlighted that transimpedance amplifiers natural exhibit a lower EMI susceptibility compared to common voltage-feedback opamps. Moreover, it will be shown through simulations that a careful circuit design can lead to opamps with a practically vanishing EMI susceptibility. © 1998 Elsevier Science Ltd. All rights reserved.
Original language | English (US) |
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Pages (from-to) | 1143-1148 |
Number of pages | 6 |
Journal | Microelectronics Reliability |
Volume | 38 |
Issue number | 6-8 |
DOIs | |
State | Published - Jan 1 1998 |
Externally published | Yes |
Bibliographical note
Generated from Scopus record by KAUST IRTS on 2023-02-15ASJC Scopus subject areas
- Surfaces, Coatings and Films
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
- Condensed Matter Physics