Degradation Processes and Aging in Quantum Dot Lasers on Silicon

Matteo Meneghini, Matteo Buffolo, Michele Zenari, Carlo De Santi, Robert W. Herrick, Chen Shang, Yating Wan, Kaiyin Feng, Eamonn Hughes, John Bowers, Gaudenzio Meneghesso, Enrico Zanoni

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We discuss the physical processes for the degradation of quantum-dot lasers epitaxially grown on silicon. Through combined electro-optical measurements and deep-level transient spectroscopy, we conclude a pathway to obtain significant improvement in device lifetime.

Original languageEnglish (US)
Title of host publication2023 Conference on Lasers and Electro-Optics, CLEO 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781957171258
StatePublished - 2023
Event2023 Conference on Lasers and Electro-Optics, CLEO 2023 - San Jose, United States
Duration: May 7 2023May 12 2023

Publication series

Name2023 Conference on Lasers and Electro-Optics, CLEO 2023

Conference

Conference2023 Conference on Lasers and Electro-Optics, CLEO 2023
Country/TerritoryUnited States
CitySan Jose
Period05/7/2305/12/23

Bibliographical note

Publisher Copyright:
© Optica Publishing Group 2023 © 2023 The Author(s)

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Science Applications
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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