Decoupling the sequence of dielectric breakdown in single device bilayer stacks by radiation-controlled, spatially localized creation of oxide defects

Fernando L. Aguirre, Alok Ranjan, Nagarajan Raghavan, Andrea Padovani, Sebastian Matias Pazos, Nahuel Vega, Nahuel Muller, Mario Debray, Joel Molina-Reyes, Kin Leong Pey, Felix Palumbo

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