Decoupling the sequence of dielectric breakdown in single device bilayer stacks by radiation-controlled, spatially localized creation of oxide defects
Fernando L. Aguirre, Alok Ranjan, Nagarajan Raghavan, Andrea Padovani, Sebastian Matias Pazos, Nahuel Vega, Nahuel Muller, Mario Debray, Joel Molina-Reyes, Kin Leong Pey, Felix Palumbo
Research output: Contribution to journal › Article › peer-review
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