Abstract
The characteristics of metalorganic vapor-phase epitaxy (MOVPE)-grown GaN layers have been compared with the chemical features of the gaseous phase during growth. The chemical features were evaluated by growth simulation. Two- and three-flow methods were used for GaN MOVPE. It was found both by growth and by simulation that the two-flow is superior to the three-flow method as regards uniformity and quality of the GaN layers.
Original language | English (US) |
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Pages (from-to) | 489-493 |
Number of pages | 5 |
Journal | Physica Status Solidi (A) Applied Research |
Volume | 194 |
Issue number | 2 SPEC. |
DOIs | |
State | Published - Dec 2002 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics