Recently, the electrical switching of antiferromagnetic (AFM) order has been intensively investigated because of its application potential in data storage technology. Herein, we report the current switching of the AFM Néel vector in epitaxial Pd/CoO films as a function of temperature. Using combined measurements of Hall resistance (HR) and x-ray magnetic linear dichroism (XMLD) below and above the AFM Néel temperature, we unambiguously identified both magnetic and nonmagnetic contributions to the current-induced HR change. Through magnetic field-induced HR measurements, we quantitatively determined the percentage of current-induced CoO spin switching. Further, we showed that the thermal effect dominated the CoO magnetic switching more in samples with a thinner Pd layer and that samples with a thicker CoO layer required higher thermal activation for current-induced magnetic switching. These results provide a clear and comprehensive picture of current-induced AFM spin switching across the AFM Néel temperature.
|Original language||English (US)|
|Journal||Physical Review B|
|State||Published - Dec 5 2022|
Bibliographical noteKAUST Repository Item: Exported on 2022-12-08
Acknowledged KAUST grant number(s): ORA-CRG10-2021-4665
Acknowledgements: This work was supported by the National Natural Science Foundation of China (Grants No. 12104003, No. 12174364, No. 11734006, and No. 11974079), the Users with Excellence Program of Hefei Science Center CAS (Grant No. 2021HSCUE003), the Natural Science Foundation of Anhui Province (Grant No. 2108085QA20), the Fundamental Research Funds for the Central Universities (No. wk2310000104), and the Open Fund of the State Key Laboratory of Surface Physics of Fudan University (Grant No. KF2020_06 and KF2021_05). This work was also supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division under Contract No. DE-AC02-05-CH11231 (van der Waals heterostructures program, KCWF16). This research used resources of the Advanced Light Source, which is a DOE Office of Science User Facility under Contract No. DE-AC02-05CH11231 and Beamlines MCD-A and MCD-B (Soochow Beamline for Energy Materials) at NSRL. The nanofabrication in this work was carried out at the USTC Center for Micro and Nanoscale Research and Fabrication. This publication is based upon work supported by King Abdullah University of Science and Technology under Award No. ORA-CRG10-2021-4665.