Cross beam lithography (FIB+EBL) and dip pen nanolithography for nanoparticle conductivity measurements

Stefano Cabrini^*, Robert J. Barsotti, Alessandro Carpentiero, Luca Businaro, Remo Proietti Zaccaria, Francesco Stellacci, Enzo Di Fabrizio

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review