TY - GEN
T1 - Critical parameters affecting the design of high frequency transmission lines in standard CMOS technology
AU - Al Attar, Talal
AU - Alshehri, Abdullah
AU - Almansouri, Abdullah Saud Mohammed
AU - Al-Turki, Abdullah Turki
N1 - KAUST Repository Item: Exported on 2020-10-01
PY - 2017/5/13
Y1 - 2017/5/13
N2 - Different structures of transmission lines were designed and fabricated in standard CMOS technology to estimate some critical parameters including the RMS value of the surface roughness and the loss tangent. The input impedances for frequencies up to 50 GHz were modeled and compared with measurements. The results demonstrated a strong correlation between the used model with the proposed coefficients and the measured results, attesting the robustness of the model and the reliability of the incorporated coefficients values.
AB - Different structures of transmission lines were designed and fabricated in standard CMOS technology to estimate some critical parameters including the RMS value of the surface roughness and the loss tangent. The input impedances for frequencies up to 50 GHz were modeled and compared with measurements. The results demonstrated a strong correlation between the used model with the proposed coefficients and the measured results, attesting the robustness of the model and the reliability of the incorporated coefficients values.
UR - http://hdl.handle.net/10754/623676
UR - http://ieeexplore.ieee.org/document/7916053/
UR - http://www.scopus.com/inward/record.url?scp=85020114834&partnerID=8YFLogxK
U2 - 10.23919/ROPACES.2017.7916053
DO - 10.23919/ROPACES.2017.7916053
M3 - Conference contribution
SN - 9780996007832
BT - 2017 International Applied Computational Electromagnetics Society Symposium - Italy (ACES)
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -