Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films

A. Ranjan, S. J. O'Shea, M. Bosman, J. Molina, N. Raghavan, K. L. Pey

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

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Engineering

Material Science

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Chemical Engineering