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Correlation between the reliability of ultra-thin ISSG SiO2 and hydrogen content
T. Y. Luo, H. N. Al-Shareef, G. A. Brown, M. Laughery, V. H.C. Watt, A. Karamcheti, Marc Jackson, H. R. Huff
Research output: Contribution to journal › Article › peer-review
3
Scopus
citations