Abstract
© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. NEXAFS spectroscopy is used to precisely quantify the interfacial composition and P3HT chain orientation at the weak P3HT:PCBM/PEDOT:PSS interface. An increase of P3HT:PCBM and PEDOT:PSS interdiffusion with post electrode deposition annealing time and temperature is found to be the underlying mechanism for effectively improving the interlayer adhesion, which is essential for the commercial realization of organic photovoltaic devices.
Original language | English (US) |
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Pages (from-to) | 1400135 |
Journal | Advanced Materials Interfaces |
Volume | 1 |
Issue number | 7 |
DOIs | |
State | Published - Jul 10 2014 |
Externally published | Yes |
Bibliographical note
KAUST Repository Item: Exported on 2020-10-01Acknowledged KAUST grant number(s): KUS-C1-015-21
Acknowledgements: This research was supported by the Center for Advanced Molecular Photovoltaics (CAMP) supported by King Abdullah University of Science and Technology (KAUST) under award no. KUS-C1-015-21. Portions of this research were carried out at the Stanford Synchrotron Radiation Lightsource, a Directorate of SLAC National Accelerator Laboratory and an Office of Science User Facility operated for the U.S. Department of Energy Office of Science by Stanford University.
This publication acknowledges KAUST support, but has no KAUST affiliated authors.