Control charts and efficient sampling methodologies in the field of photovoltaics

C. Allebé; B. Govaerts; Emmanuel Van Kerschaver; S. De Wolf; J. Szlufcik

Control charts and efficient sampling methodologies in the field of photovoltaics

C. Allebé, B. Govaerts, Emmanuel Van Kerschaver^*, S. De Wolf, J. Szlufcik

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.

Original language	English (US)
Pages (from-to)	387-390
Number of pages	4
Journal	Conference Record of the IEEE Photovoltaic Specialists Conference
State	Published - 2002
Externally published	Yes
Event	29th IEEE Photovoltaic Specialists Conference - New Orleans, LA, United States Duration: May 19 2002 → May 24 2002

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Cite this

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title = "Control charts and efficient sampling methodologies in the field of photovoltaics",

abstract = "Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.",

author = "C. Alleb{\'e} and B. Govaerts and {Van Kerschaver}, Emmanuel and {De Wolf}, S. and J. Szlufcik",

year = "2002",

language = "English (US)",

pages = "387--390",

journal = "Conference Record of the IEEE Photovoltaic Specialists Conference",

issn = "0160-8371",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "29th IEEE Photovoltaic Specialists Conference ; Conference date: 19-05-2002 Through 24-05-2002",

}

TY - JOUR

T1 - Control charts and efficient sampling methodologies in the field of photovoltaics

AU - Allebé, C.

AU - Govaerts, B.

AU - Van Kerschaver, Emmanuel

AU - De Wolf, S.

AU - Szlufcik, J.

PY - 2002

Y1 - 2002

N2 - Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.

AB - Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.

UR - http://www.scopus.com/inward/record.url?scp=0036948551&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0036948551

SN - 0160-8371

SP - 387

EP - 390

JO - Conference Record of the IEEE Photovoltaic Specialists Conference

JF - Conference Record of the IEEE Photovoltaic Specialists Conference

T2 - 29th IEEE Photovoltaic Specialists Conference

Y2 - 19 May 2002 through 24 May 2002

ER -

Control charts and efficient sampling methodologies in the field of photovoltaics

Abstract

ASJC Scopus subject areas

UN SDGs

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