Conductivity and charge trapping after electrical stress in amorphous and polycrystalline Al2O3Based Devices Studied With AFM-Related Techniques

Mario Lanza, Marc Porti, Montserrat Nafra, Xavier Aymerich, Gnther Benstetter, Edgar Lodermeier, Heiko Ranzinger, Gert Jaschke, Steffen Teichert, Lutz Wilde, Pawel Piotr Michalowski

Research output: Contribution to journal › Article › peer-review

31 Scopus citations

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