Bibliographical noteKAUST Repository Item: Exported on 2020-11-03
Acknowledgements: E.H.S. and all coauthors from the Department of Electrical and Computer Engineering at the University of Toronto acknowledge the financial support from the Ontario Research Fund–Research Excellence Program, the Natural Sciences and Engineering Research Council of Canada (NSERC), and the Global Research Outreach program of Samsung Advanced Institute of Technology. Z.-H.L. and all coauthors from the Department of Materials Science and Engineering at the University of Toronto acknowledge the financial support from the NSERC (grant number 216956-12) and the National Natural Science Foundation of China (grant number 11774304). Computations were performed on the Niagara supercomputer at the SciNet HPC Consortium. SciNet is funded by the Canada Foundation for Innovation, the Government of Ontario, Ontario Research Fund–Research Excellence, and the University of Toronto.