Fingerprint
Dive into the research topics of 'Charge trapping memory with 2.85-nm Si-nanoparticles embedded in HfO2'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Charge trapping memory with 2.85-nm Si-nanoparticles embedded in HfO2
N. El-Atab, B. B. Turgut, A. K. Okyay, A. Nayfeh
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review