Characterization of Y2SiO5:Ce thin films

E. Coetsee; H. C. Swart; J. J. Terblans; O. M. Ntwaeaborwa; K. T. Hillie; W. A. Jordaan; Ulrich Buttner

doi:10.1016/j.optmat.2006.06.009

Characterization of Y₂SiO₅:Ce thin films

E. Coetsee, H. C. Swart^*, J. J. Terblans, O. M. Ntwaeaborwa, K. T. Hillie, W. A. Jordaan, Ulrich Buttner

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

Uncoated and SnO₂-coated Y₂SiO₅:Ce thin film phosphors grown on Si (1 0 0) substrates by a pulsed laser deposition technique were characterized with scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-Ray analysis (EDS) and X-Ray diffraction (XRD). Cathodoluminescence (CL) of both the uncoated and SnO₂-coated thin film phosphors was investigated for possible application in low voltage field emission displays (FEDs). Blue emission with peak values at 440 and 500 nm was from spherically shaped particles distributed unevenly on the surfaces of both the uncoated and coated thin film phosphors.

Original language	English (US)
Pages (from-to)	1338-1343
Number of pages	6
Journal	Optical Materials
Volume	29
Issue number	11
DOIs	https://doi.org/10.1016/j.optmat.2006.06.009
State	Published - Jan 1 2007

Keywords

AFM
Cathodoluminescence
EDS
PLD
SEM
Thin films
XRD
YSiO:Ce

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Computer Science(all)
Atomic and Molecular Physics, and Optics
Spectroscopy
Physical and Theoretical Chemistry
Organic Chemistry
Inorganic Chemistry
Electrical and Electronic Engineering

Access to Document

10.1016/j.optmat.2006.06.009

Cite this

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title = "Characterization of Y2SiO5:Ce thin films",

abstract = "Uncoated and SnO2-coated Y2SiO5:Ce thin film phosphors grown on Si (1 0 0) substrates by a pulsed laser deposition technique were characterized with scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-Ray analysis (EDS) and X-Ray diffraction (XRD). Cathodoluminescence (CL) of both the uncoated and SnO2-coated thin film phosphors was investigated for possible application in low voltage field emission displays (FEDs). Blue emission with peak values at 440 and 500 nm was from spherically shaped particles distributed unevenly on the surfaces of both the uncoated and coated thin film phosphors.",

keywords = "AFM, Cathodoluminescence, EDS, PLD, SEM, Thin films, XRD, YSiO:Ce",

author = "E. Coetsee and Swart, {H. C.} and Terblans, {J. J.} and Ntwaeaborwa, {O. M.} and Hillie, {K. T.} and Jordaan, {W. A.} and Ulrich Buttner",

year = "2007",

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doi = "10.1016/j.optmat.2006.06.009",

language = "English (US)",

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T1 - Characterization of Y2SiO5:Ce thin films

AU - Coetsee, E.

AU - Swart, H. C.

AU - Terblans, J. J.

AU - Ntwaeaborwa, O. M.

AU - Hillie, K. T.

AU - Jordaan, W. A.

AU - Buttner, Ulrich

PY - 2007/1/1

Y1 - 2007/1/1

N2 - Uncoated and SnO2-coated Y2SiO5:Ce thin film phosphors grown on Si (1 0 0) substrates by a pulsed laser deposition technique were characterized with scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-Ray analysis (EDS) and X-Ray diffraction (XRD). Cathodoluminescence (CL) of both the uncoated and SnO2-coated thin film phosphors was investigated for possible application in low voltage field emission displays (FEDs). Blue emission with peak values at 440 and 500 nm was from spherically shaped particles distributed unevenly on the surfaces of both the uncoated and coated thin film phosphors.

AB - Uncoated and SnO2-coated Y2SiO5:Ce thin film phosphors grown on Si (1 0 0) substrates by a pulsed laser deposition technique were characterized with scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-Ray analysis (EDS) and X-Ray diffraction (XRD). Cathodoluminescence (CL) of both the uncoated and SnO2-coated thin film phosphors was investigated for possible application in low voltage field emission displays (FEDs). Blue emission with peak values at 440 and 500 nm was from spherically shaped particles distributed unevenly on the surfaces of both the uncoated and coated thin film phosphors.

KW - AFM

KW - Cathodoluminescence

KW - EDS

KW - PLD

KW - SEM

KW - Thin films

KW - XRD

KW - YSiO:Ce

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