Characterization of Y2SiO5:Ce thin films

E. Coetsee, H. C. Swart*, J. J. Terblans, O. M. Ntwaeaborwa, K. T. Hillie, W. A. Jordaan, U. Buttner

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Scopus citations


Uncoated and SnO2-coated Y2SiO5:Ce thin film phosphors grown on Si (1 0 0) substrates by a pulsed laser deposition technique were characterized with scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-Ray analysis (EDS) and X-Ray diffraction (XRD). Cathodoluminescence (CL) of both the uncoated and SnO2-coated thin film phosphors was investigated for possible application in low voltage field emission displays (FEDs). Blue emission with peak values at 440 and 500 nm was from spherically shaped particles distributed unevenly on the surfaces of both the uncoated and coated thin film phosphors.

Original languageEnglish (US)
Pages (from-to)1338-1343
Number of pages6
JournalOptical Materials
Issue number11
StatePublished - Jul 2007
Externally publishedYes


  • AFM
  • Cathodoluminescence
  • EDS
  • PLD
  • SEM
  • Thin films
  • XRD
  • YSiO:Ce

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering
  • Spectroscopy
  • Inorganic Chemistry
  • Physical and Theoretical Chemistry
  • Organic Chemistry


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