Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEM

Y. W. Ho*, V. Ng, W. K. Choi, S. P. Ng, T. Osipowicz, H. L. Seng, W. W. Tjui, K. Li

*Corresponding author for this work

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