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Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEM
Y. W. Ho*, V. Ng, W. K. Choi, S. P. Ng, T. Osipowicz, H. L. Seng, W. W. Tjui, K. Li
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
6
Scopus
citations