Carrier behavior in the vicinity of pit defects in GaN characterized by ultraviolet light-assisted Kelvin probe force microscopy

Cui Hong Kai, Xiao Juan Sun*, Yu Ping Jia, Zhi Ming Shi, Ke Jiang, Jian Wei Ben, You Wu, Yong Wang, He Nan Liu, Xiao Hang Li, Da Bing Li

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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