Abstract
Ion implantation and laser processing technologies are very attractive for the fabrication of industrially feasible interdigitated back-contact (IBC) solar cells. In this work, p+ emitters were fabricated by boron implantation and laser annealing, and the electrical properties of emitters were investigated. An emitter sheet resistance (Rsh) in the range of 30-200 Ω/ could be achieved by varying the implanted dose. The saturation current density (Joe) of the passivated p+ emitter with Rsh of ∼ 125 Ω/ reached 95 fA/cm2, and the contact resistivity was determined to be as low as 5 × 10-6 Ω cm2. Such localized p+ emitters can be applied to ntype IBC solar cells, which could avoid the high temperature thermal annealing step and related problems.
Original language | English (US) |
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Pages (from-to) | 320-325 |
Number of pages | 6 |
Journal | Energy Procedia |
Volume | 55 |
DOIs | |
State | Published - 2014 |
Externally published | Yes |
Event | 4th International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2014 - Hertogenbosch, Netherlands Duration: Mar 25 2014 → Mar 27 2014 |
Bibliographical note
Publisher Copyright:© 2014 The Authors. Published by Elsevier Ltd.
Keywords
- Ion implantation
- Laser annealing
- N-type interdigitated back-contact solar cells
- Silicon solar cells
ASJC Scopus subject areas
- General Energy