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Bimodal Dielectric Breakdown in Electronic Devices Using Chemical Vapor Deposited Hexagonal Boron Nitride as Dielectric
Felix Palumbo, Xianhu Liang, Bin Yuan, Yuanyuan Shi, Fei Hui, Marco A. Villena, Mario Lanza
Research output: Contribution to journal › Article › peer-review
15
Scopus
citations