Abstract
Kernel methods have revolutionized the fields of pattern recognition and machine learning. Their success, however, critically depends on the choice of kernel parameters. Using Gaussian process (GP) classification as a working example, this paper focuses on Bayesian inference of covariance (kernel) parameters using Markov chain Monte Carlo (MCMC) methods. The motivation is that, compared to standard optimization of kernel parameters, they have been systematically demonstrated to be superior in quantifying uncertainty in predictions. Recently, the Pseudo-Marginal MCMC approach has been proposed as a practical inference tool for GP models. In particular, it amounts in replacing the analytically intractable marginal likelihood by an unbiased estimate obtainable by approximate methods and importance sampling. After discussing the potential drawbacks in employing importance sampling, this paper proposes the application of annealed importance sampling. The results empirically demonstrate that compared to importance sampling, annealed importance sampling can reduce the variance of the estimate of the marginal likelihood exponentially in the number of data at a computational cost that scales only polynomially. The results on real data demonstrate that employing annealed importance sampling in the Pseudo-Marginal MCMC approach represents a step forward in the development of fully automated exact inference engines for GP models.
Original language | English (US) |
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Title of host publication | Proceedings - International Conference on Pattern Recognition |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 614-619 |
Number of pages | 6 |
ISBN (Electronic) | 9781479952083 |
DOIs | |
State | Published - Dec 4 2014 |
Event | 22nd International Conference on Pattern Recognition, ICPR 2014 - Stockholm, Sweden Duration: Aug 24 2014 → Aug 28 2014 |
Publication series
Name | Proceedings - International Conference on Pattern Recognition |
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ISSN (Print) | 1051-4651 |
Conference
Conference | 22nd International Conference on Pattern Recognition, ICPR 2014 |
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Country/Territory | Sweden |
City | Stockholm |
Period | 08/24/14 → 08/28/14 |
Bibliographical note
Publisher Copyright:© 2014 IEEE.
ASJC Scopus subject areas
- Computer Vision and Pattern Recognition