Abstract
Accurate fitting of measured current-voltage [I(V)I(V)] data is crucial to the correct analysis and understanding of metal-insulator–metal (MIM) diodes, especially for optical rectennas. With the commonly used polynomial fitting of the I(V)I(V) data, the order of the fit can drastically affect the diode performance metrics such as resistance, responsivity, and asymmetry. Additionally, the resulting fitting coefficients provide no useful parameters. An exponential-based equation can fit the I(V)I(V) data well, can avoid artifacts from the choice of order of the polynomial, and allows for the accurate calculation of diode performance metrics directly from the fitting coefficients. Connecting the performance metrics to fitting coefficients shows a correspondence between zero-bias responsivity and asymmetry at any given voltage.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 28-33 |
| Number of pages | 6 |
| Journal | Measurement |
| Volume | 120 |
| DOIs | |
| State | Published - Feb 7 2018 |
| Externally published | Yes |
Bibliographical note
KAUST Repository Item: Exported on 2020-10-01Acknowledgements: The authors would like to thank David Doroski and Brad Herner for their assistance in fabricating the MIM devices and Miena Armanious, Ayendra Weerakkody and John Stearns for their helpful discussions. This work was carried out in part under contract from RedWave Energy Inc. and funded in part by the Advanced Research Projects Agency - Energy (ARPA-E), U.S. Department of Energy, under Award Number DE-AR0000676. Also, research reported in this publication was supported by competitive research funding from King Abdullah University of Science and Technology (KAUST). G. Moddel holds stock in RedWave Energy, Inc.
This publication acknowledges KAUST support, but has no KAUST affiliated authors.