Auger-generated hot carrier current in photo-excited forward biased single quantum well blue light emitting diodes

Andrew C. Espenlaub, Abdullah I. Alhassan, Shuji Nakamura, Claude Weisbuch, James S. Speck

Research output: Contribution to journalArticlepeer-review

10 Scopus citations


We report on measurements of the photo-modulated current-voltage and electroluminescence characteristics of forward biased single quantum well, blue InGaN/GaN light emitting diodes with and without electron blocking layers. Low intensity resonant optical excitation of the quantum well was observed to induce an additional forward current at constant forward diode bias, in contrast to the usual sense of the photocurrent in photodiodes and solar cells, as well as an increased electroluminescence intensity. The presence of an electron blocking layer only slightly decreased the magnitude of the photo-induced current at constant forward bias. Photo-modulation at constant forward diode current resulted in a reduced diode bias under optical excitation. We argue that this decrease in diode bias at constant current and the increase in forward diode current at constant applied bias can only be due to additional hot carriers being ejected from the quantum well as a result of an increased Auger recombination rate within the quantum well.
Original languageEnglish (US)
Pages (from-to)141106
JournalApplied Physics Letters
Issue number14
StatePublished - Apr 3 2018
Externally publishedYes

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01
Acknowledgements: This work was supported by the US Department of Energy Solid-State Lighting Program under Agreement No. DE-EE0007096 and the KACST-KAUST-UCSB Solid State Lighting Program (SSLP).
This publication acknowledges KAUST support, but has no KAUST affiliated authors.


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