Atomic resolution Z-contrast imaging and EELS: Application for Ge/SiO 2 interface

S. Lopatin; G. Duscher; W. Windl

doi:10.1017/s1431927603444097

Atomic resolution Z-contrast imaging and EELS: Application for Ge/SiO ₂ interface

S. Lopatin^*, G. Duscher, W. Windl

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	818-819
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	9
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/s1431927603444097
State	Published - 2003
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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@article{043f81d22aba4622863018983bfdf271,

title = "Atomic resolution Z-contrast imaging and EELS: Application for Ge/SiO 2 interface",

author = "S. Lopatin and G. Duscher and W. Windl",

year = "2003",

doi = "10.1017/s1431927603444097",

language = "English (US)",

volume = "9",

pages = "818--819",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Atomic resolution Z-contrast imaging and EELS

T2 - Application for Ge/SiO 2 interface

AU - Lopatin, S.

AU - Duscher, G.

AU - Windl, W.

PY - 2003

Y1 - 2003

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U2 - 10.1017/s1431927603444097

DO - 10.1017/s1431927603444097

M3 - Article

AN - SCOPUS:0042922842

SN - 1431-9276

VL - 9

SP - 818

EP - 819

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Atomic resolution Z-contrast imaging and EELS: Application for Ge/SiO 2 interface

ASJC Scopus subject areas

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Atomic resolution Z-contrast imaging and EELS: Application for Ge/SiO ₂ interface