Performance in analog integrated circuits strongly depends on the mismatch between nominally identical devices. In this work we derive closed-form asymptotic expressions describing mismatch variance in multifinger structures, under the assumption of Gaussian autocorrelation for the mismatch-generating stochastic process. The analysis is performed on interdigitated geometries, eventually modified to make them common-centroid. Comparison with the numerical results provided by an independent model validates the theoretical expressions presented here.
|Original language||English (US)|
|Title of host publication||Proceedings - IEEE International Symposium on Circuits and Systems|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|State||Published - Jan 1 2020|