Asymptotic expressions of mismatch variance in interdigitated geometries

Carmine Paolino, Fabio Pareschi, Riccardo Rovatti, Gianluca Setti

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Performance in analog integrated circuits strongly depends on the mismatch between nominally identical devices. In this work we derive closed-form asymptotic expressions describing mismatch variance in multifinger structures, under the assumption of Gaussian autocorrelation for the mismatch-generating stochastic process. The analysis is performed on interdigitated geometries, eventually modified to make them common-centroid. Comparison with the numerical results provided by an independent model validates the theoretical expressions presented here.
Original languageEnglish (US)
Title of host publicationProceedings - IEEE International Symposium on Circuits and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781728133201
StatePublished - Jan 1 2020
Externally publishedYes

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