Asymptotic expressions of mismatch variance in interdigitated geometries

Carmine Paolino; Fabio Pareschi; Riccardo Rovatti; Gianluca Setti

Asymptotic expressions of mismatch variance in interdigitated geometries

Carmine Paolino, Fabio Pareschi, Riccardo Rovatti, Gianluca Setti

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Performance in analog integrated circuits strongly depends on the mismatch between nominally identical devices. In this work we derive closed-form asymptotic expressions describing mismatch variance in multifinger structures, under the assumption of Gaussian autocorrelation for the mismatch-generating stochastic process. The analysis is performed on interdigitated geometries, eventually modified to make them common-centroid. Comparison with the numerical results provided by an independent model validates the theoretical expressions presented here.

Original language	English (US)
Title of host publication	Proceedings - IEEE International Symposium on Circuits and Systems
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781728133201
State	Published - Jan 1 2020
Externally published	Yes

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2023-02-15

Cite this

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title = "Asymptotic expressions of mismatch variance in interdigitated geometries",

abstract = "Performance in analog integrated circuits strongly depends on the mismatch between nominally identical devices. In this work we derive closed-form asymptotic expressions describing mismatch variance in multifinger structures, under the assumption of Gaussian autocorrelation for the mismatch-generating stochastic process. The analysis is performed on interdigitated geometries, eventually modified to make them common-centroid. Comparison with the numerical results provided by an independent model validates the theoretical expressions presented here.",

author = "Carmine Paolino and Fabio Pareschi and Riccardo Rovatti and Gianluca Setti",

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T1 - Asymptotic expressions of mismatch variance in interdigitated geometries

AU - Paolino, Carmine

AU - Pareschi, Fabio

AU - Rovatti, Riccardo

AU - Setti, Gianluca

N1 - Generated from Scopus record by KAUST IRTS on 2023-02-15

PY - 2020/1/1

Y1 - 2020/1/1

N2 - Performance in analog integrated circuits strongly depends on the mismatch between nominally identical devices. In this work we derive closed-form asymptotic expressions describing mismatch variance in multifinger structures, under the assumption of Gaussian autocorrelation for the mismatch-generating stochastic process. The analysis is performed on interdigitated geometries, eventually modified to make them common-centroid. Comparison with the numerical results provided by an independent model validates the theoretical expressions presented here.

AB - Performance in analog integrated circuits strongly depends on the mismatch between nominally identical devices. In this work we derive closed-form asymptotic expressions describing mismatch variance in multifinger structures, under the assumption of Gaussian autocorrelation for the mismatch-generating stochastic process. The analysis is performed on interdigitated geometries, eventually modified to make them common-centroid. Comparison with the numerical results provided by an independent model validates the theoretical expressions presented here.

UR - http://www.scopus.com/inward/record.url?scp=85109297869&partnerID=8YFLogxK

M3 - Conference contribution

SN - 9781728133201

BT - Proceedings - IEEE International Symposium on Circuits and Systems

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Asymptotic expressions of mismatch variance in interdigitated geometries

Abstract

Bibliographical note

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