Abstract
Understanding and measuring the size-dependent surface strain of nanowires are essential to their applications in various emerging devices. Here, we report on the diameter-dependent surface strain and Young's modulus of single-crystalline Co nanowires investigated by in situ X-ray diffraction measurements. Diameter-dependent initial longitudinal elongation of the nanowires is observed and ascribed to the anisotropic surface stress due to the Poisson effect, which serves as the basis for mechanical measurements. As the nanowire diameter decreases, a transition from the "smaller is softer" regime to the "smaller is tougher" regime is observed in the Young's modulus of the nanowires, which is attributed to the competition between the elongation softening and the surface stiffening effects. Our work demonstrates a new nondestructive method capable of measuring the initial surface strain and estimating the Young's modulus of single crystalline nanowires, and provides new insights on the size effect. © 2013 The Royal Society of Chemistry.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 11643 |
| Journal | Nanoscale |
| Volume | 5 |
| Issue number | 23 |
| DOIs | |
| State | Published - 2013 |
Bibliographical note
KAUST Repository Item: Exported on 2020-10-01Acknowledgements: The authors gratefully acknowledge the financial support from the National Natural Science Foundation of China (Grant no. 11174285), the Innovation Centre of Singapore-MIT Alliance for Research and Technology (Grant no. ING12050-ENG(IGN)) and Singapore Ministry of Education (Grant no. RG44/12).
ASJC Scopus subject areas
- General Materials Science