Analysis of deuterium in V-Fe5at.% film by atom probe tomography (APT)

Ryota Gemma, Tala'at Al-Kassab, Reiner Kirchheim, Astrid A. Pundt

Research output: Chapter in Book/Report/Conference proceedingConference contribution

22 Scopus citations


V-Fe5at.% 2 and 10-nm thick single layered films were prepared by ion beam sputtering on W substrate. They were loaded with D from gas phase at 0.2 Pa and at 1 Pa, respectively. Both lateral and depth D distribution of these films was investigated in detail by atom probe tomography. The results of analysis are in good agreement between the average deuterium concentration and the value, expected from electromotive force measurement on a similar flat film. An enrichment of deuterium at the V/W interface was observed for both films. The origin of this D-accumulation was discussed in respect to electron transfer, mechanical stress and misfit dislocations. © 2010 Elsevier B.V. All rights reserved.
Original languageEnglish (US)
Title of host publicationJournal of Alloys and Compounds
PublisherElsevier BV
Number of pages1
StatePublished - Sep 2011

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01

ASJC Scopus subject areas

  • Materials Chemistry
  • Mechanics of Materials
  • Metals and Alloys
  • Mechanical Engineering


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