Analysis of deuterium in V-Fe5at.% film by atom probe tomography (APT)

Ryota Gemma; Tala'at Al-Kassab; Reiner Kirchheim; Astrid A. Pundt

doi:10.1016/j.jallcom.2010.11.122

Analysis of deuterium in V-Fe5at.% film by atom probe tomography (APT)

Ryota Gemma, Tala'at Al-Kassab, Reiner Kirchheim, Astrid A. Pundt

Physical Sciences and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

22 Scopus citations

Abstract

V-Fe5at.% 2 and 10-nm thick single layered films were prepared by ion beam sputtering on W substrate. They were loaded with D from gas phase at 0.2 Pa and at 1 Pa, respectively. Both lateral and depth D distribution of these films was investigated in detail by atom probe tomography. The results of analysis are in good agreement between the average deuterium concentration and the value, expected from electromotive force measurement on a similar flat film. An enrichment of deuterium at the V/W interface was observed for both films. The origin of this D-accumulation was discussed in respect to electron transfer, mechanical stress and misfit dislocations. © 2010 Elsevier B.V. All rights reserved.

Original language	English (US)
Title of host publication	Journal of Alloys and Compounds
Publisher	Elsevier BV
Pages	S872-S876
Number of pages	1
DOIs	https://doi.org/10.1016/j.jallcom.2010.11.122
State	Published - Sep 2011

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01

ASJC Scopus subject areas

Materials Chemistry
Mechanics of Materials
Metals and Alloys
Mechanical Engineering

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10.1016/j.jallcom.2010.11.122

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@inproceedings{2b0537fca6f54e5e978a101925c60137,

title = "Analysis of deuterium in V-Fe5at.% film by atom probe tomography (APT)",

abstract = "V-Fe5at.% 2 and 10-nm thick single layered films were prepared by ion beam sputtering on W substrate. They were loaded with D from gas phase at 0.2 Pa and at 1 Pa, respectively. Both lateral and depth D distribution of these films was investigated in detail by atom probe tomography. The results of analysis are in good agreement between the average deuterium concentration and the value, expected from electromotive force measurement on a similar flat film. An enrichment of deuterium at the V/W interface was observed for both films. The origin of this D-accumulation was discussed in respect to electron transfer, mechanical stress and misfit dislocations. {\textcopyright} 2010 Elsevier B.V. All rights reserved.",

author = "Ryota Gemma and Tala'at Al-Kassab and Reiner Kirchheim and Pundt, {Astrid A.}",

note = "KAUST Repository Item: Exported on 2020-10-01",

year = "2011",

month = sep,

doi = "10.1016/j.jallcom.2010.11.122",

language = "English (US)",

pages = "S872--S876",

booktitle = "Journal of Alloys and Compounds",

publisher = "Elsevier BV",

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TY - GEN

T1 - Analysis of deuterium in V-Fe5at.% film by atom probe tomography (APT)

AU - Gemma, Ryota

AU - Al-Kassab, Tala'at

AU - Kirchheim, Reiner

AU - Pundt, Astrid A.

N1 - KAUST Repository Item: Exported on 2020-10-01

PY - 2011/9

Y1 - 2011/9

N2 - V-Fe5at.% 2 and 10-nm thick single layered films were prepared by ion beam sputtering on W substrate. They were loaded with D from gas phase at 0.2 Pa and at 1 Pa, respectively. Both lateral and depth D distribution of these films was investigated in detail by atom probe tomography. The results of analysis are in good agreement between the average deuterium concentration and the value, expected from electromotive force measurement on a similar flat film. An enrichment of deuterium at the V/W interface was observed for both films. The origin of this D-accumulation was discussed in respect to electron transfer, mechanical stress and misfit dislocations. © 2010 Elsevier B.V. All rights reserved.

AB - V-Fe5at.% 2 and 10-nm thick single layered films were prepared by ion beam sputtering on W substrate. They were loaded with D from gas phase at 0.2 Pa and at 1 Pa, respectively. Both lateral and depth D distribution of these films was investigated in detail by atom probe tomography. The results of analysis are in good agreement between the average deuterium concentration and the value, expected from electromotive force measurement on a similar flat film. An enrichment of deuterium at the V/W interface was observed for both films. The origin of this D-accumulation was discussed in respect to electron transfer, mechanical stress and misfit dislocations. © 2010 Elsevier B.V. All rights reserved.

UR - http://hdl.handle.net/10754/564421

UR - https://linkinghub.elsevier.com/retrieve/pii/S0925838810028859

UR - http://www.scopus.com/inward/record.url?scp=80052799128&partnerID=8YFLogxK

U2 - 10.1016/j.jallcom.2010.11.122

DO - 10.1016/j.jallcom.2010.11.122

M3 - Conference contribution

SP - S872-S876

BT - Journal of Alloys and Compounds

PB - Elsevier BV

ER -

Analysis of deuterium in V-Fe5at.% film by atom probe tomography (APT)

Abstract

Bibliographical note

ASJC Scopus subject areas

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